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Product news

High Resolution Particle Size Analysis from 0.1µm -3,500 µm with Laser Diffraction in One Range

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For the first time the new R-Series of the well-proven HELOS laser diffraction system enables an integrated particle size analysis from 0.1 µm to 3,500 µm in the parallel laser beam. Based on the measurement of 217 diffraction intensities the size distribution is calculated in 62 points. The high accuracy of the result obtained allows the measurement of broadest distribution with a ratio of x10 to x90 > 1000 and qualifies the HELOS for a exact quantitative calculation of fractions of broad mixtures.

More information:     Sympatec GmbH    
Placed: 18/03/2009 Shown: news 528 x