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In the field of particle size measurement, laser diffraction techniques have established a tremendous reputation covering every range of size measurement from the nanometer up to several millimetres. Its advantage: fast analysis times, good reproducibility, flexibility, ease of operation and calibration and large measurable particle size ranges in one single measurement.
FRITSCH has successfully developed and manufactured Laser Particle Sizers for over 20 years and has made considerable contribution to the further development of laser diffraction through its invaluable innovations, like the introduction of the Inverse Fourier Optic. The Inverse Fourier Optic in laser diffraction was first recognised and patented by FRITSCH and later included in the laser diffraction standard ISO 13320-1 under the title "Reverse Fourier Optic".
The use of the Inverse Fourier Optic enables variations of the measurement range without the need to exchange the imaging lens like it is needed by conventional optical set-ups. It is also possible to adapt the measuring range to the respective sample system in a manner similar to a zoom lens, making optimum use of the entire sensor surface in each case. This enables a very good differentiation of particles with only a small size difference (i.e. higher resolution).
With the four systems COMPACT, MicroTec, MicroTec XT and NanoTec, the ANALYSETTE 22 product series covers a wide range of applications to suit customers’ varied requirements.
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